The difficulties related to the design and execution of Electrostatic Discharge (ESD) defense circuits are ending up being increasingly complex as innovation is scaled well into nano-metric programs. Standard techniques of Flip Gate ESD design may not be adequate as the ESD damages occur at successively lower voltages in nano-metric measurements.
There are numerous difficulties that must be fulfilled in order to design robust ESD circuits today. Due to innovation scaling and proliferation of automated handling, Flip Gate ESDfailures in ICs caused by Charged Device Design (CDM) are increasing. CDM discharges can trigger latent damages which could deteriorate and eventually lead to definite failures in the ICs.
The ESD defense design for current and future sub-65nm CMOS circuits is a difficulty for high I/O count, multiple power domains and flip-chip items. Flip Gate ESD Security Gadget and Circuit Design for Advanced CMOS Technologies is meant for practicing engineers operating in the areas of circuit design, VLSI dependability and testing domains.
As the problems connected with Flip Gate ESD failures and yield losses end up being significant in the contemporary semiconductor industry, the demand for graduates with a basic understanding of ESD is likewise increasing. Today, there is a considerable demand to educate the circuits style and reliability groups on ESD issues. This book makes an attempt to attend to the ESD style and execution in an organized way. A style procedure involving device simulators along with circuit simulator is utilized to enhance device and circuit specifications for optimum ESD in addition to circuit efficiency. This method, explained in Flip Gate ESDDefense Device and Circuit Design for Advanced CMOS Technologies has resulted in several successful Flip Gate ESDcircuit styles with excellent silicon results demonstrating its strengths.